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Sensors and Materials, Volume 31, Number 11(4) (2019)
Copyright(C) MYU K.K.
pp. 3749-3764
S&M2046 Research Paper of Special Issue
https://doi.org/10.18494/SAM.2019.2448
Published: November 30, 2019

Application of Optimal Ellipsoid Fitting for Curvature Change Tracking in Main Reflector of Complex Antenna Structures [PDF]

Hyukgil Kim and Sungnam Hong

(Received May 20, 2019; Accepted September 27, 2019)

Keywords: VLBI, main reflector, curvature, 3D ellipsoid fitting, close-range photogrammetry

In this study, a curvature change tracking program was developed to evaluate curvature changes in the main reflector of a very long baseline interferometry (VLBI) antenna structure. The data from the geometric model that was developed by fitting the main reflector into a three-dimensional (3D) ellipsoid model were used as the fundamental data for the tracking program. The 3D ellipsoid fitting model was established using the 3D position coordinates of the feature points on the reflector surface extracted through nontarget-based close-range photogrammetry. To enhance the fitting accuracy of the 3D ellipsoid model, the optimal parameters were calculated by minimizing the residuals between the conjugate points and the ellipsoid fitting model and by removing outliers. As a result, it was statistically confirmed that the fitting accuracy of the ellipsoid model was improved. The improved ellipsoid model was incorporated into the curvature change tracking program. The developed program will be used to evaluate the structural stability of the main reflector based on periodic curvature calculations, which can also be used as fundamental data for repair and reinforcement work in the future.

Corresponding author: Sungnam Hong


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Cite this article
Hyukgil Kim and Sungnam Hong, Application of Optimal Ellipsoid Fitting for Curvature Change Tracking in Main Reflector of Complex Antenna Structures, Sens. Mater., Vol. 31, No. 11, 2019, p. 3749-3764.



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