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Sensors and Materials
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Sensors and Materials, Volume 31, Number 1(2) (2019)
Copyright(C) MYU K.K.
S&M1755 Research Paper of Special Issue
Published in advance: October 3, 2018
Published: January 30, 2019
White Organic Light-emitting Diode Using Nano-double Ultrathin Carrier-trapping Materials in Performance Stability [PDF]
Juin J. Liou, Wen-Ray Chen, Chih-Chieh Kang, Kuan-Wei Lee, Shih-Wei Feng, and Chien-Jung Huang
(Received May 17, 2018; Accepted August 3, 2018)
Keywords: trapping layer, electroluminescence, charge trapping, color purity, OLED
The structure of indium tin oxide (ITO) (100 nm)/molybdenum trioxide (MoO3) (15 nm)/N,N0-bis-(1-naphthyl)-N,N0-biphenyl-1,10-biphenyl-4,40-diamine (NPB) (40 nm)/4,4’-bis(2,2-diphenylvinyl)-1,1’-biphenyl (DPVBi) (10 nm)/5,6,11,12-tetraphenylnaphthacene (rubrene) (0.2 nm)/DPVBi (24 nm)/rubrene (0.2 nm)/DPVBi (6 nm)/4,7-diphenyl-1,10-phenanthroline (BPhen):cesium carbonate (Cs2Co3) (10 nm)/Mg:Ag (6 nm)/Al (120 nm) white organic light-emitting diode (WOLED) with high color purity and stability was fabricated. The function of the multiple-ultrathin material (MUTM), such as rubrene, is as the yellow light-emitting layer and trapping layer. The results show that the MUTM has excellent carrier capture effect, resulting in high color stability of the device at different applied voltages. The Commission Internationale De L’Eclairage (CIE) coordinate of this device at 3–7 V shows a few displacements and a very slight variation of (±0.01, ±0.01). The maximum brightness of 9986 cd/m2 and CIE coordinates of (0.346, 0.339) are obtained at 7 V. The enhanced performance of the device may result from the direct charge trapping in MUTM, and it can be found in the electroluminescence (EL) process.
Corresponding author: Wen-Ray Chen, Chien-Jung Huang
This work is licensed under a Creative Commons Attribution 4.0 International License.
Cite this article
Juin J. Liou, Wen-Ray Chen, Chih-Chieh Kang, Kuan-Wei Lee, Shih-Wei Feng, and Chien-Jung Huang, White Organic Light-emitting Diode Using Nano-double Ultrathin Carrier-trapping Materials in Performance Stability, Sens. Mater., Vol. 31, No. 1, 2019, p. 131-139.
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