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Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
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Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.
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Sensors and Materials
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is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.
Instructions to authors
English 日本語
Instructions for manuscript preparation
English 日本語
Template
English
Publisher
MYU K.K.
Sensors and Materials
1-23-3-303 Sendagi,
Bunkyo-ku, Tokyo 113-0022, Japan
Tel: 81-3-3827-8549
Fax: 81-3-3827-8547
MYU Research, a scientific publisher, seeks a native English-speaking proofreader with a scientific background. B.Sc. or higher degree is desirable. In-office position; work hours negotiable. Call 03-3827-8549 for further information.
MYU Research
(proofreading and recording)
MYU K.K.
(translation service)
The Art of Writing Scientific Papers
(How to write scientific papers)
(Japanese Only)
Sensors and Materials, Volume 28, Number 11 (2016)
Copyright(C) MYU K.K.
Copyright(C) MYU K.K.
|
pp. 1203-1210
S&M1281 Research Paper of Special Issue https://doi.org/10.18494/SAM.2016.1410 Published: November 16, 2016 Investigation on Reduction Behaviors of SnO2 and SnO2-Supported CuO Sensor Materials by Temperature-Programmed Reduction Method Combined with Resistance Measurement [PDF] Hiroyuki Yamaura, Shinsuke Hirao, Syuhei Yamaguchi, and Hidenori Yahiro (Received May 30, 2016; Accepted August 15, 2016) Keywords: TPR measurement, resistance measurement, semiconductor, tin oxide, copper oxide
Temperature-programmed reduction measurement combined with resistance measurement (TPR&R) was performed to investigate the reduction behavior of the samples containing the semiconductor materials, SnO2 and CuO/SnO2. The four reduction peaks were observed in the H2-TPR profile of SnO2, being assigned to the reductions of surface adsorbed oxygen species, surface lattice oxygen, amorphous SnO2 and bulk SnO2. On the other hand, the H2-TPR profile of CuO/SnO2 was more complicated than that of SnO2. The TPR&R measurement enabled definite assignments of the six reduction peaks of CuO/SnO2: the reductions of (I) Cu2+ to Cu+ in highly dispersed copper oxide, (II) bulk CuO to Cu0, (III) Cu+ to Cu0 in highly dispersed copper oxide, (IV) SnO2 lattice oxygen interacting with highly dispersed copper oxide, (V) amorphous SnO2, and (VI) bulk SnO2.
Corresponding author: Hidenori Yahiro Cite this article Hiroyuki Yamaura, Shinsuke Hirao, Syuhei Yamaguchi, and Hidenori Yahiro, Investigation on Reduction Behaviors of SnO2 and SnO2-Supported CuO Sensor Materials by Temperature-Programmed Reduction Method Combined with Resistance Measurement, Sens. Mater., Vol. 28, No. 11, 2016, p. 1203-1210. |
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