pp. 223-232
S&M22 Research Paper Published: 1988 Nondestructive Evaluation of Si and GaAs Ingots Using Ultrasonic Computed Tomography [PDF] Yoshiro Tomikawa, Mitsuhiro Nishida, Naohiro Ishiguro and Hiroaki Yamada Cite this article Yoshiro Tomikawa, Mitsuhiro Nishida, Naohiro Ishiguro and Hiroaki Yamada, Nondestructive Evaluation of Si and GaAs Ingots Using Ultrasonic Computed Tomography, Sens. Mater., Vol. 1, No. 4, 1988, p. 223-232. |